Texas instruments has unveiled a new super-fast AD converter that enables the fastest measurements across a wider spectrum

TI's latest ADC has 8-ghz bandwidth and 10.4-gsps sampling rate, covering the widest spectrum for 5G testing, oscilloscope and radar applications.

Beijing, May 23, 2019 - Texas instruments (TI) today launched a new ultra-high speed ADC with wide bandwidth, leading sampling rate and low power consumption.ADC12DJ5200RF can help engineers to achieve 5G test application and high precision measurement of oscilloscope, as well as direct x-band sampling of radar application.

TI will present the ADC12DJ5200RF at booth 1272 at the international microwave symposium (IMS) on June 4, 2019 at solstice 6 in Boston.

Fastest measurement over a wider spectrum

Wider bandwidth: at 8 GHz frequencies, the ADC12DJ5200RF enables engineers to achieve up to 20% of analog input bandwidth and can directly digitize very high frequencies without additional power consumption, cost, and down-conversion dimensions.

Faster 12-bit ADC: in dual-channel mode, the ADC12DJ5200RF sampling rate is 5.2 gigasamples/s (GSPS) and captures instantaneous bandwidth up to 2.6 GHz (IBW) at a 12-bit resolution.In the single-channel mode, the new ultra-fast ADC has a sampling rate of 10.4 GSPS and can capture IBW up to 5.2 GHz.

Efficient interface: as the first stand-alone GSPS ADC to support the JESD204C standard interface, the ADC12DJ5200RF helps minimize the number of serializers/decoders channels required to output data to the field programmable gate array (FPGA), enabling designers to achieve higher data rates.

Design with high performance and stability in the range of power supply and temperature

High signal detection sensitivity: ADC12DJ5200RF has the highest dynamic performance within the range of power supply changes, even under the lowest specifications. By providing ultra-high sensitivity receivers, the smallest and weakest signals can be detected, thus improving signal intelligence.In addition, the device also includes internal high-frequency vibration, which can improve the performance without clutter interference.

High measurement accuracy: TI's new ultra-high speed ADC greatly reduces the system error, offset error as low as 300 V, and zero temperature drift.

Lower cers: engineers designing test and measurement equipment can take advantage of the very low bit error rate (CER) of ADC12DJ5200RF to achieve high measurement repeatability.

Reduce solution size by 30% and power consumption by 20%

Smaller footprint: the size of the ADC12DJ5200RF is 10 mm x 10 mm, which is 30% smaller than the discrete solution and can help engineers save circuit board space.The new super-fast ADC also reduces the number of channels and helps with smaller PCB designs.

Reduced power consumption: the low energy consumption of ADC12DJ5200RF 4-w can help engineers minimize heat dissipation and simplify the overall thermal management in the design, which is 20% lower than similar ADC products.

Tools and support to speed up design

Test the new superfast ADC using the AFE7444EVM and AFE7422EVM evaluation modules, now available from TI stores and authorized resellers.

Read "multi-chip synchronous reference design for clock and power optimization." engineers can use the ADC12DJ5200RF quick boot design.